2dmatに関連した論文
[1] |
(重要論文) Data-analysis software framework 2DMAT and its application to experimental measurements for two-dimensional material structuresYuichi Motoyama, Kazuyoshi Yoshimi, Harumichi Iwamoto, Hayato Ichinose, Takeo Hoshi
Preprint:https://arxiv.org/abs/2204.04484
2DMATの全体像を記述した論文. |
---|---|
[2] |
sim-trhepd-rheed — Open-source simulator of total-reflection high-energy positron diffraction (TRHEPD) and reflection high-energy electron diffraction (RHEED)Takashi Hanada, Yuichi Motoyama, Kazuyoshi Yoshimi, Takeo Hoshi
Computer Physics Communications, in press.
Preprint:https://arxiv.org/abs/2110.09477 2DMATに接続して使われる,TRHEPD/RHEEDシミュレータ「sim-trhepd-rheed」の論文. |
[3] |
(重要論文) Data-driven sensitivity analysis in surface structure determination using total-reflection high-energy positron diffraction (TRHEPD)Takeo Hoshi, Daishiro Sakata, Shotaro Oie, Izumi Mochizuki, Satoru Tanaka, Toshio Hyodo, Koji Hukushima
Computer Physics Communications 271, 108186/1-7 (2022).
https://doi.org/10.1016/j.cpc.2021.108186 最適化法と感度解析(分散・共分散行列固有値解析)を用いた, Si4O5N3 / 6H-SiC (0001)-(√3×√3) R30°多層表面構造系の全反射高速陽電子回折(TRHEPD)データ解析. プレスリリース(鳥取大/KEK)「高速データ解析で極薄膜物質の原子配列解析を加速〜全反射高速陽電子回折における新しいデータ解析法の導入〜」 https://researchmap.jp/press_releases/press_releases/view/633014/b9c8814da20c403a9ec06c4e6cba7bd3?page_id=388285 |
[4] |
Performance prediction of massively parallel computation by Bayesian inferenceHisashi Kohashi, Harumichi Iwamoto, Takeshi Fukaya, Yusaku Yamamoto, Takeo Hoshi
|
[5] |
Two-stage data-analysis method for total-reflection high-energy positron diffraction (TRHEPD)Kazuyuki Tanaka, Izumi Mochizuki, Takashi Hanada, Ayahiko Ichimiya, Toshio Hyodo, Takeo Hoshi
JJAP Conf. Series, in press;
Preprint:https://arxiv.org/abs/2002.12165 2020 グリッド型探索・逐次最適化法(Nelder-Mead法)を組み合わせた2段階データ解析を用いた, 全反射高速陽電子回折(TRHEPD)のテストデータ解析(テスト系:Ge(001)-c(4×2)表面). |
[6] |
Development of data-analysis software for total-reflection high-energy positron diffraction (TRHEPD)Kazuyuki Tanaka, Takeo Hoshi, Izumi Mochizuki, Takashi Hanada, Ayahiko Ichimiya, Toshio Hyodo
Acta. Phys. Pol. A 137(3) 188-192 2020
http://dx.doi.org/10.12693/APhysPolA.137.188 逐次最適化法(Nelder-Mead法)を用いた,全反射高速陽電子回折(TRHEPD)のテストデータ解析(テスト系:Si(001)-(2×1)表面). |